Investigation of informative CBDP and SCoT markers for leaf rust, powdery mildew and septoria leaf blotch diseases in spring wheat genotypes

Document Type : Research Paper

Authors

1 M.Sc. Student, Department of Plant Production, College of Agriculture and Natural Resources, University of Gonbad Kavous, Gonbad, Iran.

2 Assistant Professor, Department of Plant Production, College of Agriculture and Natural Resources, University of Gonbad Kavous, Gonbad, Iran.

3 Associate Professor, Department of Plant Production, College of Agriculture and Natural Resources, University of Gonbad Kavous, Gonbad, Iran.

4 Department of Horticulture and crop research, Golestan Kavous Agricultural and Natural Resources Research and Education Center, Agricultural Research, Education and Extension Organization (AREEO), Gonbad Kavous, Iran.

Abstract

Fungal leaf diseases are the most destructive factors to wheat (Triticum aestivum L.) yield. Therefore, identification of resistance sources to important fungal diseases is a great importance to increase wheat yield. In order to identify informative CBDP and SCoT markers for leaf rust, powdery mildew and septoria leaf blotch disease, 63 wheat genotypes were planted through the augment design in agricultural research station of Araghimahaleh (Gorgan) during 2018-19. Clustering based on UPGMA, put the genotypes into 3 groups with 24, 17 and 22 individuals. Among the studied genotypes, genotypes No. 49 and 60 showed highest resistance to all three diseases. Association analysis showed that from 16 CBDP and SCoT primers, 99 bands produced in total, which 43 bands were polymorph. The maximum percent of polymorphism belonged to SCoT primers and the minimum polymorphism belonged to CBDP. SCoT11-2, CBDP 10-2 was shown significant correlation with all three diseases. SCoT21-3 was also significantly (P

Keywords

Main Subjects

References

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